Test Expert能够支持各种CAD数据源,如Cadence Allegro/OrCAD, Mentor, PowerPCB, Altium/Protel, Zuken, ODB++, GenCAD, Accel, Unidat等。
如果没有CAD数据源,您也可以利用VayoPro软件(独立模块)对各种BOM数据进行分析。
丰富灵活、直观明晰的选针设置及行业最优的测试优化算法,可以保证最佳的测试选针结果。可以详细设定规则细节(大小、距离、种类、数量、优先级、强制位置等),还可以设置多个选针规则系列,同时生成不同结果用于比较差异。
在浏览结果时,不但可以看到不可测原因归类,还可以互动切换到PCB视图位置,更直观了解情况,快速制定调整方案。
有时用于PCB制作的Gerber会与PCB CAD不一致,导致测试点被阻焊层覆盖。Test Expert支持导入额外的Mask层Gerber,验证下针位置接触性,对于被覆盖的测试位置可以重新定位。另外,Test Expert独有的Net Link功能可以帮助快速发现欧姆电阻、保险丝、开关等“连通”的网络,优化合并网络,从而提升测试网络覆盖率/可测率;或者保持同意测试覆盖率的前提下,减少测试用针,降低夹具成本。
Test Expert可测试性报告包含丰富的内容:测试覆盖率百分比、测试网络详细报告、未测试网络详细报告、元器件报告、引脚下针覆盖报告、并联分析报告等;而且可以输出为不同文件格式:文本、PDF、Excel及Html。
评估不同测试方式(ICT, AOI, AXI… … )对制造缺陷的覆盖率评估;
覆盖主要制造缺陷如丢件、开路、短路、极性错误和错件
强大的夹具设计功能,可以设计出最优化的夹具,并输出各种夹具钻孔绕线等数据文档。
可以生成各种MDA/ICT/ATE精细测试程序,支持的测试设备有Keysight/Agilent, Teradyne/GenRad, Spea, TRI, Checksum, MTS, JET, Hioki, Areaflex/IFR, SRC …
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