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VayoPro-Test Expert

DFT/Testability analysis, test strategy analysis, tester programming
Intelligent PCBA Testing Analysis

VayoPro-Test Expert is an intelligent design for test (DFT) and test programming software solution for electronics manufacturing testing process requirements, it can accomplish the PCB test coverage analysis and help ICT/flying probe test programming.

Testability Analysis of Printed Circuit Boards

Rich DFT/Testability (Nail Access) Report

Test Expert offers comprehensive testability report output, covering from parts coverage report, accessible net report, inaccessible net report, insufficient probes for accessible net, parallel report. It supports output in different format like text, Excel, PDF & html.

Fast & Efficient Test Strategy Analysis

Test Expert evaluates the coverage of manufacturing defects by different testing methods (ICT, AOI, AXI...). Offering perspective on different manufacturing defects covered by different test method including missing parts, open circuits, short circuits, polarity errors, etc., making it easier to decide which test method to use.

ICT/ FTP Program Output

Test Expert can generate various MDA/ICT/ATE/AXI/AOI/flying nail fine testing programs, supporting testing equipment such as Keysight/Agilent, Teradyne/GenRad, TRI, Hioki, SRC, Takaya, Seica, etc., helping test engineers program efficiently.

Support ECAD Data & BOM

VayoPro- Test Expert supports most existing PCB CAD, intelligently identify CAD format. Extra Gerber data source (solder mask layer) can also be imported.

Powerful & Flexible Nail Selection Rules

Test Expert has powerful built-in testing nail selection rules, flexible and rich parameter setting functions, and can set detailed rule details (size, distance, type, quantity, priority, forced position, etc.). It can also set multiple nail selection rule series and generate different results for comparing differences. Meanwhile, its advanced testing optimization algorithm can also ensure the best nail selection results.

Interactive Result Query

Test Expert supports multiple ways to query test nail selection results, such as by reason for inaccessible node, network name/number, test nail number etc. You can easily review interactively.

Gerber Mask Layer Validation

In real production process, stencil Gerber may be different from original PCB ECAD design. Test Expert supports importing additional solder mask layers Gerber to verify the contact of the nail position, and can reposition the covered test positions. In addition, the unique Net Link function of Test Expert can help quickly discover "connected" networks such as ohmic resistors, fuses, switches, etc., optimizing and merging networks, improving the coverage/testability. While maintaining the same testing coverage, it reduces the amount of nails and fixture cost.

Multiple Rule Sets & Parallel Selection

Test Expert allows you to maintain multiple rule sets, and execute nail selection together, then compare testability difference and easily choose best result for fixture design & program generation.

Fixture Design& Reuse Analysis

ICT fixture design can be easily done in Test Expert with optimized nail path then output fixture data covering nails, CNC drill, nail path DXF and parts. Fixture reuse analysis is also available, helping to lower cost.

Virtual Nets Merge

In Test Expert, two nets can be merged into one for 0 Ω resistor, switch, fuse. Through nets merge, testability can be improved while decrease nail quantity.

Back Drill Identification

Back drills are very common in backplane and communication products. Back drills cannot be used as a test point for ICT and flying probe test. Test Expert can automatically identify and avoid back-drilling positions in test point analysis.

Test Expert Empowers Efficient Test Analysis & Program Generation

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