Vayo (Shanghai) Technology Co., Ltd., the leading intelligent NPI software solution provider, is pleased to announce that KATEK Frickenhausen selected VayoPro-Test Expert to build up their ICT prgramming capability.

VayoPro-Test Expert software
VayoPro-Test Expert is an intelligent testing tool for nail access testability analysis, test strategy analysis and ICT/FP/AXI/AOI program generation. It comes with powerful & flexible nail selection rules, and generates DFT/testability with comprehensive content (13 categories). Test Expert offers an easy way to accomplish advanced test strategy analysis and estimate the coverage to typical manufacturing defects (open/short/missing/…) for major test & inspection approaches. Finally it supports the output for many testers such as ICT, flying probe, AXI & AOI…

About KATEK Frickenhausen GmbH
KATEK Frickenhausen GmbH is one of the leading electronics service providers in Europe. With around 2,300 employees at locations in Germany and Eastern Europe. The range of services covers the entire life cycle of electronic assemblies and devices from development, material and project management, electronics production, box-build, testing technology and logistics to after-sales service – from small series/prototypes to large series and for all industries.

About Vayo
Vayo (Shanghai) Technology Co., Ltd., a highly innovative & software technology enterprise, dedicates to intelligent NPI software solutions for electronics industry from design to manufacturing stages. With 14 years of dedication, Vayo owns comprehensive NPI software products (intelligent DFM/DFA analysis, stencil design automation, smart pick & place programming, intelligent testing analysis & ICT/FP/AXI/AOI program generation, visual aids work instruction document, board viewer and repair tool, Gerber data view & conversion, …), and awarded patents certification from US, Japan & China. Vayo products are recognized by leading companies like Intel/GE/Bosch/Flex/Jabil/Venture and installed in more than 20 countries worldwide.