Johnson Controls Selects VayoPro-Test Expert Software


2021-05-05  Johnson Controls (Czech Republic) selects and uses Vayo’s Test Expert software for efficient test strategy analysis so as to evaluate the defects coverage of different test methods (ICT, AOI, AXI…) and optimize the test plan, thus ensuring high quality and high reliability of final product. The selection will also enable fast programming of AOI/AXI test equipment to meet the requirement of intelligence, and simplify the AOI/AXI programming process to improve engineers’ work efficiency and enterprise’s flexible manufacturing capability.

Why choose VayoPro-Test Expert Software

VayoPro -Test Expert, as a requisite software for DFT analysis and fast programming of test equipment, could maximize the CAD data and BOM data to accurately analyze the DFT/ testing coverage, complete the ICT/ Flying probe/ AOI/ X-Ray test program in a short time and expand the data analysis of test fixture. With Test Expert, days of DFT analysis work can be shortened to several minutes’, and you can also get an elaborate testing& detecting program to extensively save the time of debugging and cost of test fixture.

Features of the solution:

1.Support all kinds of CAD data, such as Altium (*.pcbdoc), Cadence(*.val),Mentor(Neutral),Zuken,ODB++(*.tgz),IPC-2581(*.xml),Gerber, etc;

  1. Import/validate BOM data and intelligently extract value and errors;
  2. Support version comparison (CAD, BOM…), analysis of fixture reuse and report output;
  3. Flexible parameter setting supports multiple component types (based on different customers, different product series,…);
  4. Powerful nail selection rule assignment and result optimization;
  5. Support execution of multiple nail selection rules at same time and results comparison;
  6. Support Gerber silk-screen data validation;
  7. Unique netlink technology, able to improve testing coverage;
  8. Powerful DFT/testability report output (include 13 items) function;
  9. High-efficiency testing strategy analysis and report output (to predict the coverage rate of main manufacturing defects);
  10. Output of ICT, fly probe, AXI and AOI equipment program.

About Johnson Controls

At Johnson Controls, they transform the environments where people live, work, learn and play. From optimizing building performance to improving safety and enhancing comfort, they drive the outcomes that matter most. Dedicated to protecting the environment, they deliver their promise in industries such as healthcare, education, data centers and manufacturing. With a global team of 100,000 experts in more than 150 countries and over 130 years of innovation, it is the power behind their customers’ mission.

For more information, visit

Why Vayo

Vayo (Shanghai) Technology Co., Ltd, founded in early 2005, is a leading industrial software manufacturing enterprise. Over the past 16 years, Vayo has been dedicated to innovating and developing intelligent NPI software solutions for OEM/EMS. With strong R&D team and experienced product specialist, Vayo helps customers fix quality defects from design to manufacturing, facilitating the improvement of electronics industry’s capability and helping realize digital intelligent manufacturing.

With persistent effort, Vayo has tackled a series of technical problems and possesses more than 30 software products with completely independent intellectual property rights and over 10 patents for invention. Up to now, Vayo’s products for NPI solution (DFM, SMT, Test, Stencil, SPI, Document, View, etc.) have been adopted by more than 400 companies from 20+ countries, covering the industry of communication network, consumer electronics, automobile and parts, education and so on. Meanwhile, Vayo has established win-win cooperative relationship with many SMT, Test, SPI, AXI, AOI equipment manufacturers and EDA suppliers around the world, such as FUJI, Keysight, Vitrox, Altium designer, Cadence allegro, etc.

Guided by the worldwide goal of intelligent manufacturing, Vayo will stay true to the mission and keep going forward.

Should you want a more efficient test strategy, visit

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